A biaxial residual stress introduction device based on white-light interferometric measurement of surface morphology一种基于白光干涉测量表面形貌的双轴残余应力引入装置

Patent summary专利简介

This invention provides a device for introducing biaxial residual stress while measuring the resulting surface morphology with white-light interferometry. The integrated loading and optical-measurement concept is intended to make residual-stress experiments more controllable and to connect the applied stress state with microscale surface deformation.

本发明提供一种双轴残余应力引入装置，并利用白光干涉方法测量加载后材料表面形貌。该装置将双轴加载与光学表面测量结合起来，使残余应力实验更加可控，并将施加的应力状态与微尺度表面变形联系起来。